LD Topos Series
Coherence Scanning Interferometry (CSI) – In-process and post-process surface metrology
LD Topos 100: Precision Surface Measurement with Sub-Nanometer Accuracy
The LD Topos 100 sets a new standard in surface measurement technology. Powered by advanced coherence scanning interferometry (white light interferometry), it delivers exceptional surface topography measurements with sub-nanometer accuracy. Effortlessly measure surface roughness, step heights, gratings, and intricate microstructures with outstanding precision and reliability.
Designed to meet the demands of semiconductors, optics, automotive, aerospace, medical devices, and energy industries, the LD Topos 100 ensures optimal performance and efficiency for advanced manufacturing applications.
Take your measurements to the next level.
Contact us today to learn more.
LD Topos One: Compact, Portable, and High-Speed Surface Metrology Solution
The LD Topos One is a versatile, high-speed CSI probe engineered for precision surface metrology. Its compact and portable design makes it ideal for in-situ and online surface measurements across industries such as precision optics, consumer electronics etc.
With the ability to measure workpieces directly on the machine tool, the LD Topos One eliminates errors caused by repositioning, streamlining workflows and boosting productivity. Experience improved manufacturing efficiency and consistently high product quality with this cutting-edge solution.
Optimize your manufacturing process with LD Topos One.
Contact us today to learn more.
Features
- Exceptional In-Process Integration
- ISO 25178 Compliant
- Enhanced Surface Reconstruction
- Robust Analysis Software
